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Dynamic Electrostatic-Discharge Path Investigation Relied on Different Impact Energies in Metal–oxide–semiconductor Circuits

Tian-Tian Xie,Jun Wang,Fei-Bo Du,Yang Yu,Yan-Fei Cai,Er-Yuan Feng,Fei Hou,Zhi-Wei Liu

CHINESE PHYSICS B（2023）

Cited 0|Views11
Key words
electrostatic discharge,trigger voltage,latch up,dV,dt effect
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