Improved epitaxy of CsI(Tl) film on Si substrate buffered by graphene for X-ray detection

The growth of the CsI(Tl) scintillators deposited on glass substrates with proper wavelength matching the mainstream semiconductor circuits is crucial for X-ray imaging industry. But the coupling loss between the scintillators and silicon based photo sensors has limited the performance. So fabricating CsI(Tl) films on monocrystalline silicon is greatly important for next-generation high performance X-ray image devices. However, the lattice and thermal mismatch between CsI(Tl) and Si always deteriorates the morphology and structure, and thus degrades the property of the CsI(Tl) scintillation converters. Here, by utilizing crystalline graphene(Gr) as a buffer layer, the van der Waals epitaxial growth of CsI(Tl) film on Si(111) substrate is reported and its advanced applications are demonstrated. The introduced graphene buffer layer extremely frees the stress between CsI(Tl) and Si substrate. Therefore, the CsI(Tl) films show perfect micro-columnar and crystalline structures, and then, exhibit much higher light output and signal to noise ratio, and better modulation transfer functions and a bar pattern X-ray image compared to that on bare Si(111) substrate. This facile method not only lays the foundation for the epitaxy of the alkali halide crystals, including CsI(Tl), onto Si-based detectors and its applications in radiation detection, but also may broaden a new perspective of deposition of CsI(Tl) scintillators into flexible substrates.