Internal defect detection method based on dual-channel speckle interferometry

Optics & Laser Technology(2023)

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摘要
•Dual-channel speckle interferometer for simultaneous measurement of out-of-plane displacement and first-order derivative was reported.•Dual wavelength measurement based on dual-biprism and the single monochromatic camera was verified.•The localization and size of internal defects were quantitatively characterized by the proposed method.•[4+1] Phase-shifting algorithm for measuring dynamic deformation.
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关键词
Dual-channel speckle interferometry,Simultaneous out-of-plane displacement and slope measurement,Internal defects localization,[4+1] phase-shifting algorithm
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