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Grain Boundary Plane Measurement Using Transmission Electron Microscopy Automated Crystallographic Orientation Mapping for Atom Probe Tomography Specimens

Matthew Hartshorne,Asher Leff,Gregory Vetterick,Emily M. Hopkins,Mitra L. Taheri

MICROSCOPY AND MICROANALYSIS（2023）

Cited 45|Views23
Key words
atom probe tomography,crystallography,electron diffraction,grain boundary plane,transmission electron microscopy
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