Molecular plating of Am-241 on a Schottky metal contact

M. Kathryn Hoffman,Henry B. Spitz, Patrick H. Bissmeyer, Sriharsha Mangu,Sha Xue,R. Gregory Downing, Vasil Hlinka,Lei R. Cao

Journal of Radioanalytical and Nuclear Chemistry(2022)

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摘要
This paper describes a molecular plating method in which americium-241 (Am-241) was directly deposited onto a 4.8 mm x 4.8 mm Schottky electrode of 4 H-SiC devices. The plating solution consists of isopropanol and dilute nitric acid. Plating was conducted for one hour using a high voltage between 300 and 600 V to plate the radionuclide. A gasket with an aluminized mylar contact surface was added to a traditional disposable electrodeposition cell to accommodate the small size of the diode. Deposition recoveries of 50–65% have been consistently achieved using 20–30 nCi of Am-241 with minimal damage to the diode surface.
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关键词
Molecular plating, Electrodeposition, americium-241, Silicon carbide
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