Fabrication of Specimens for Atom Probe Tomography Using a Combined Gallium and Neon Focused Ion Beam Milling Approach
MICROSCOPY AND MICROANALYSIS（2023）
Key words
atom probe tomography,focused ion beam,gas field ionization source,neon ions
AI Read Science
Must-Reading Tree
Example
Generate MRT to find the research sequence of this paper
Chat Paper
Summary is being generated by the instructions you defined