A reference-area-free strain mapping method using precession electron diffraction data

Ultramicroscopy(2023)

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摘要
•A new algorithm that measures elastic strain at the nano-scale using precession electron diffraction data was developed.•This algorithm does not require the identification of the ``strain-free'' area to generate strain maps.•This algorithm does not require the crystals to be tilted to the zone axis to generate strain maps.
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关键词
Strain mapping,Precession electron diffraction (PED),Denoise,VO2,Shape memory alloys (SMA)
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