Specific Emitter Identification Using Regression Analysis between Individual Features and Physical Parameters
2022 6th International Conference on Imaging, Signal Processing and Communications (ICISPC)(2022)
摘要
In this paper, a semi-physical simulation platform and ADS are used to acquire the signals of three types of specific emitters, then high-order spectral analysis and variational modal decomposition are used to extract features of the signals. The phase noise of the oscillator and the bias voltage of the power amplifier are used as independent variables to study their influence on the features, based on which the correlation analysis is carried out. Regression fitting is performed on the variables with significant correlation to obtain a regression function, then a feature-weighted support vector machine is constructed for classification. The results show that the accuracy of the proposed identification algorithm using regression analysis is more than 10 percent higher than that of the single-kernel support vector machine under the same signal-to-noise ratio.
更多查看译文
关键词
specific emitter identification,feature extraction,regression analysis,weighted support vector machine
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要