Study of Single Event Latch-Up Hardness for CMOS Devices with a Resistor in Front of DC-DC Converter
ELECTRONICS（2023）
关键词
CMOS devices,single event latch-up (SEL),single event effect (SEE),resistor,pulsed laser
AI 理解论文
溯源树
样例
生成溯源树，研究论文发展脉络
Chat Paper
正在生成论文摘要