Testing and Assessment on the Short-Circuit Withstand Capability of Press-Pack IGBT Considering the Unbalanced Clamping Forces
IEEE JOURNAL OF EMERGING AND SELECTED TOPICS IN POWER ELECTRONICS（2023）
Key words
Insulated gate bipolar transistors,Clamps,Force,Logic gates,Finite element analysis,Analytical models,Conductivity,Insulated gate bipolar transistor (IGBT),press-pack (PP),short-circuit (SC) withstand capacity,unbalanced clamping force
AI Read Science
Must-Reading Tree
Example
Generate MRT to find the research sequence of this paper
Chat Paper
Summary is being generated by the instructions you defined