Dislocation structures after creep in an Al-3.85 %Mg alloy studied using EBSD-KAM technique

Itziar Serrano-Munoz,Ricardo Fernández,Romeo Saliwan-Neumann,Gaspar González-Doncel,Giovanni Bruno

Materials Letters（2023）

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摘要

•EBSD-KAM is used to investigate creep-induced strain accumulation in Al-3.85%Mg.•Prior to the KAM calculation, a denoise filter was used.•An increase in the thickness of the strain bands with increasing load is observed.•Results are indicative of enhanced short-circuit diffusion by dislocation pipes.

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关键词

Steady-state creep,Al-3.85%Mg alloy,Power-law breakdown,Electron backscatter diffraction (EBSD),Denoising filter

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