Transfer Learning for Rapid Extraction of Thickness from Optical Spectra of Semiconductor Thin Films.
Siyu Isaac Parker Tian,Zekun Ren,Selvaraj Venkataraj,Yuanhang Cheng,Daniil Bash,Felipe Oviedo,J. Senthilnath,Vijila Chellappan,Yee-Fun Lim,Armin G. Aberle,Benjamin P. MacLeod,Fraser G. L. Parlane,Curtis P. Berlinguette,Qianxiao Li,Tonio Buonassisi,Zhe Liu CoRR（2022）
关键词
Optoelectronic Materials
AI 理解论文
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