Reliability of Computing-In-Memory Concepts Based on Memristive Arrays

Memristive Computing-in-Memory (CIM) allows for very dense and fast parallel data processing. However, the correctness in logic computing is limited due to operation variability and inherent memristive device variability. We review the current situation of reliability studies in memristive CIM and propose a novel framework for estimating operation failures in CIM-concepts using VCM-ReRAM devices.