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An advanced workflow for single-particle imaging with the limited data at an X-ray free-electron laser. Corrigendum

Dameli Assalauova,Young Yong Kim, Sergey Bobkov,Ruslan Khubbutdinov,Max Rose, Roberto Alvarez,Jakob Andreasson,Eugeniu Balaur, Alice Contreras,Hasan DeMirci,Luca Gelisio,Janos Hajdu,Mark S. Hunter,Ruslan P. Kurta,Haoyuan Li, Matthew McFadden,Reza Nazari,Peter Schwander,Anton Teslyuk,Peter Walter

IUCrJ（2022）

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摘要
An error in Fig. 3(c) of the article by Assalauova et al. [IUCrJ (2020), 7, 1102–1113] is corrected.
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关键词
coherent X-ray diffractive imaging (CXDI),free-electron lasers,single particles,XFEL
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