Terahertz data analysis for the design and characterization of thin films

Terahertz time-domain spectroscopy is a powerful tool for characterizing material properties that were experimentally inaccessible until recently. For multilayered systems, the signal presents echoes with characteristics related to the optical properties of each corresponding layer. However, if the layers are very thin, echoes in the time domain may overlap and more complex and specific methods of analysis should be used to calculate the optical properties of the samples. In this work, we implement four different reported methods for analyzing thin layered samples and we compare them to evaluate their capabilities and results.