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QTL Mapping of Yield Components and Kernel Traits in Wheat Cultivars TAM 112 and Duster

Zhen Wang,Smit Dhakal,Mustafa Cerit,Shichen Wang,Yahya Rauf,Shuhao Yu,Frank Maulana,Wangqi Huang,Joshua D. Anderson,Xue-Feng Ma,Jackie C. Rudd,Amir M. H. Ibrahim,Qingwu Xue,Dirk B. Hays,Amy Bernardo,Paul St. Amand,Guihua Bai,Jason Baker,Shannon Baker,Shuyu Liu

Frontiers in Plant Science（2022）

Cited 6|Views34

Key words

wheat,QTL mapping,multiple-environment trials,yield components,kernel traits

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