TID Characterization of 24-45nm COTS NAND Flash for Space Applications

B. Tanios, O. Perrotin, B. Forgerit, F. Tilhac, F.X. Guerre, C. Poivey

2021 21th European Conference on Radiation and Its Effects on Components and Systems (RADECS)（2021）

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摘要

This work presents a comparative study of Total Ionizing Dose (TID) radiation sensitivity of five COTS (commercial off-the-shelf) 24-45 nm NAND flash memories for space applications.

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关键词

COTS,NAND flash,Total Ionizing Dose

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