Single Event Effects Characterization of 24-36nm COTS NAND Flash for Space Applications
2021 21th European Conference on Radiation and Its Effects on Components and Systems (RADECS)(2021)
摘要
This work presents a comparative study of Single Event Effects (SEE) radiation sensitivity of two COTS (commercial off-the-shelf) 24-36 nm NAND flash memories for space applications.
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关键词
COTS,NAND flash,Single Event Effects
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