A general enhancement method for test strategy generation for the sequential fault diagnosis of complex systems

•We present a general enhancement method that is suitable for most existing test strategy generation algorithms based on a multi-signal model.•The performance of the test strategy generation of each algorithm is improved after enhancement.•Using SVM and ECA*, the dimension of the dependency matrix can be reduced dynamically.•The morphological parameters can be obtained by Monte Carlo simulation.•The error can be estimated by classification accuracy, clustering and morphological parameters.