Reference survey spectra of elemental solid measured with Cr K-alpha photons as a tool for Quases analysis (4): Group III and IV elements (B, Al, In, C, Si, Ge, Sn, Pb)

C. Zborowski,T. Conard,A. Vanleenhove,I. Hoflijk,I. Vaesen

SURFACE SCIENCE SPECTRA（2022）

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摘要

Several pure bulk materials were analyzed using laboratory-based hard x-ray photoelectron spectroscopy. The spectra are surveys measured using monochromatic Cr K-alpha radiation at 5414.8 eV after removal of surface contamination or oxidation. These aim to be references for inelastic background analysis using the Tougaard method.

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关键词

HAXPES, Cr K-alpha, Tougaard, Quases, inelastic background, elements, survey

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