Automatic Testing of a Silicon Photonic Reconfigurable Add/Drop Multiplexer

Matteo Petrini, Rita Baldi,Francesco Morichetti,Andrea Melloni

2022 IEEE Photonics Society Summer Topicals Meeting Series (SUM)（2022）

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摘要

A novel method to perform both electrical and optical testing of Photonic Circuit is presented. The use of probe card to electrically access and characterize the device enables the execution of a new approach for the calibration and cloning of filter-based devices.

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关键词

Photonic wafer level testing,Reconfigurable Photonic Integrated Circuits,Silicon Photonics

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