Temporal Observation of Barkhausen Avalanche with Short-Range Interaction in Perpendicularly Magnetized Thin Film

We present here a method for measuring the temporal Bakehausen scaling exponent in a two-dimensional thin film. The scaling exponent with long-range interaction is observed to be consistent with theoretical and experimental results. In addition, we demonstrate the characteristic exponent with short-range interaction. Our method contributes to the understanding of DW dynamics and helps to optimize spintronic devices.