Terahertz Electric Field Microscopy of Ultrafast Near-fields

Moritz B. Heindl,Nicholas Kirkwood,Tobias Lauster,Julia A. Lang,Markus Retsch,Paul Mulvaney,Georg Herink

Conference on Lasers and Electro-Optics（2022）

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摘要

We present a new ultrafast field microscope based on the visible luminescence of semiconductor quantum dots. The quantum-confined Stark-effect enables the resolution of Terahertz near-fields beyond the diffraction limit.

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关键词

Terahertz electric field microscopy,ultrafast near-fields,ultrafast field microscope,visible luminescence,semiconductor quantum dots,quantum-confined Stark-effect,Terahertz near-fields

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