Reflectance Multispectral Imaging for Identification of Algae Contamination in High Voltage Insulators

R.M.L.S. Ramanayake,H.M.N.B. Senarath,J.M.V.D.B. Jayasundara,G. W. K. Prabhath,H.M.H.K. Weerasooriya,Manjula Fernando,Sarath Kumara,H. M. V. R. Herath,G. M. R. I. Godaliyadda,M. P. B. Ekanayake,Sarangi N. P. Athukorala

OSA Imaging and Applied Optics Congress 2021 (3D, COSI, DH, ISA, pcAOP)（2021）

引用 1|浏览6

暂无评分

摘要

An algorithm to identify the algal contamination in high voltage insulators using Bhattacharyya distance, through Ultraviolet-Visible-Near Infrared multispectral images obtained utilizing an in-house developed multispectral imaging system.

查看译文

AI 理解论文

溯源树

样例

生成溯源树，研究论文发展脉络

Chat Paper

正在生成论文摘要