NVDimm-FE: A High-density 3D Architecture of 3-bit/c 2TnCFE to Break Great Memory Wall with 10 ns of PGM-pulse, 10 10 Cycles of Endurance, and Decade Lifetime at 103 °C.

E. R. Hsieh, J. K. Chang,T. Y. Tang,Y. J. Li, C. W. Liang, M. Y. Lin,S. Y. Huang,C. J. Su, J. C. Guo, Steve S. Chung

2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)（2022）

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