Study of the properties of local isolates of Parastagonospora nodorum

To study the cultural, morphological and pathogenic properties of fungi that cause Septoria blotch of wheat in the conditions of the Kirov region, phytopathogenic fungi were isolated from the affected plants. Of the 38 fungal isolates selected in pure culture, eight were identified by cultural and morphological features as Parastagonospora nodorum which causes Septoria nodorum blotch (SNB). To confirm the species identity, the DNA of fungi was used for real-time PCR using the commercial test system "Septorioz zlakov (Stagonospora nodorum)" ("AgroDiagnostika", Russia). Based on experimental data, a modification of the method for isolating fungi that cause Septoria blotch of wheat is proposed. Cultural and morphological properties of local P. nodorum isolates (TR1, TR2, P12, H7, H9, KR, SR, TC) were characterized on potato-glucose agar ( PGA). The use of malt-yeast agar as a medium in comparison with PGA stimulated the growth rate of the P. nodorum KR isolate and did not affect the growth rate of other fungal isolates. Evaluation of the pathogenic properties of local P. nodorum isolates on wheat plants showed that TC and H9 isolates are highly pathogenic. These isolates can be used to screen the resistance to SN B of a wide range of wheat genotypes grown in the Kirov region.