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Vulnerability evaluation on 16 nm FinFET Ultrascale+ MPSoC using fault injection and proton irradiation

Yonghong Li,Weitao Yang,Maocheng Wang,Yang Li,Yaxin Guo,Pei Li,Haoyu Zhao,Chaohui He, Di Wang, Ye Yang,Xiaodong Zhang,Heng An

Microelectronics Reliability（2022）

Cited 0|Views24
Key words
Ultrascale+ MPSoC,Vulnerability,Dynamic partial reconfiguration,Fault injection,Proton irradiation
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