Investigation of Transient Two-Stage Thermal Equivalent RC Network of SOI-MOSFETs Using Nano Double-Pulse Measurement
IEEE Transactions on Electron Devices（2022）
Key words
Nano double-pulse measurement,network identification by deconvolution (NID),self-heating effect (SHE),silicon-on-insulator(SOI) MOSFETs,thermal equivalent RC network,thermal time constant
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