Chrome Extension
WeChat Mini Program
Use on ChatGLM

Soft Error Mechanism in SOI D Flip-Flop Induced by Space Electrostatic Discharge

Microelectronics Reliability(2022)

Cited 1|Views18
Key words
Spacecraft charging induced electrostatic discharge,D flip-flop,soft errors,HSPICE
AI Read Science
Must-Reading Tree
Example
Generate MRT to find the research sequence of this paper
Chat Paper
Summary is being generated by the instructions you defined