Uncertainties in Small-Signal and Large-Signal Measurements of RF Amplifiers Using a VNA

Dilbagh Singh,Martin J. Salter,Susan Johny,Nick M. Ridler

IEEE Instrumentation & Measurement Magazine（2022）

引用 0|浏览4

暂无评分

摘要

Uncertainties in typical small-signal and large-signal amplifier parameters measured using a vector network analyzer (VNA) are investigated in this paper. Methods to evaluate the measurement uncertainty in return losses, input power, output power, power gain, 1 dB compression point, etc., based on the use of the VNA dynamic uncertainty option (VNA-DUO) software tool from Keysight Technologies, are applied to a commercial amplifier between 0.5 GHz and 8 GHz.

查看译文

关键词

return loss measurement,Keysight Technologies,VNA-DUO software tool,large-signal measurement uncertainty,small-signal measurement uncertainty,VNA dynamic uncertainty option,power gain measurement,output power measurement,input power measurement,vector network analyzer,large-signal amplifier parameters,RF amplifiers,frequency 0.5 GHz to 8.0 GHz,gain 1.0 dB

AI 理解论文

溯源树

样例

生成溯源树，研究论文发展脉络

Chat Paper

正在生成论文摘要