Determination of the Interdiffusion Coefficient at Low Temperature in Ni/NiCr Nanometer-Scale Multilayers Using X-ray ReflectivityA. Debelle,A. Michel, M. Loyer-Prost,T. Rieger,A. Billard,M. NastarMaterialia（2022）引用 2|浏览39AI 理解论文溯源树样例生成溯源树，研究论文发展脉络Chat Paper正在生成论文摘要
