Research on the performance of SRAM for low temperature operation

As an important part of VLSI, SRAM has been widely used in the control systems of various deep space exploration detectors and satellites in recent years with the continuous development of aerospace technology. As an electronic device that stores information, once the stored information changes, the change will be passed down through the circuit layer by layer, causing a series of abnormal situations. In the face of deep space and low temperature service environment, the low temperature characteristics of SRAM determine whether SRAM can be used normally at low temperature. How to ensure that SRAM can be used normally in deep space and low temperature environment is the focus of research. Therefore, relevant quality assurance work must be carried out for SRAM, among which the electrical performance test under low temperature environment is very important.