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Bias Temperature Instability of MOSFETs: Physical Processes, Models, and Prediction

Jian Fu Zhang,Rui Gao,Meng Duan,Zhigang Ji,Weidong Zhang,John Marsland

Electronics（2022）

Cited 9|Views21
Key words
reliability,instability,aging,degradation,bias temperature instability (BTI),NBTI,PBTI,yield,device variations,lifetime prediction
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