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Tackling Data Scarcity with Transfer Learning: A Case Study of Thickness Characterization from Optical Spectra of Perovskite Thin Films

Siyu Isaac Parker Tian,Zekun Ren,Selvaraj Venkataraj,Yuanhang Cheng,Daniil Bash,Felipe Oviedo,J. Senthilnath,Vijila Chellappan,Yee-Fun Lim,Armin G. Aberle,Benjamin P. Macleod,Fraser G. L. Parlane,Curtis P. Berlinguette,Qianxiao Li,Tonio Buonassisi,Zhe Liu

Digital Discovery（2024）

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Materials Discovery
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