Novel time domain ptychography, i2PIE, for improved contrast in nonlinear microscopy

George Dwapanyin,Dirk Spangenberg,Thomas Feurer,Alexander M. Heidt,Gurthwin Bosman,Pieter Neethling,Erich G. Rohwer

Advances in Microscopic Imaging III（2021）

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摘要

We present a novel nonlinear microscopy modality using a time-domain ptychographic phase measurement, i²PIE, to compress 80 MHz supercontinuum pulses from an ANDi PCF used as excitation source, improving contrast at reduced average power.

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关键词

novel time domain ptychography,microscopy,improved contrast,nonlinear

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