Ferroelectric Phase Content in 7 nm Hf (1− x ) Zr x O 2 Thin Films Determined by X‐Ray‐Based MethodsVineetha Mukundan,Steven Consiglio,Dina H. Triyoso,Kandabara Tapily,Martin E. McBriarty,Sandra Schujman,Karsten Beckmann,Jubin Hazra,Vidya Kaushik,Nathaniel Cady,Robert D. Clark,Gert J. Leusink,Alain C. Dieboldphysica status solidi (a)(2021)引用 6|浏览5暂无评分AI 理解论文溯源树样例生成溯源树,研究论文发展脉络Chat Paper正在生成论文摘要