A Janovec‐Kay‐Dunn‐Like Behavior at Thickness Scaling in Ultra‐Thin Antiferroelectric ZrO 2 FilmsNujhat Tasneem,Yasmin Mohamed Yousry,Mengkun Tian,Milan Dopita,Sebastian E. Reyes‐Lillo,Josh Kacher,Nazanin Bassiri‐Gharb,Asif Islam KhanAdvanced Electronic Materials(2021)引用 4|浏览0暂无评分AI 理解论文溯源树样例生成溯源树,研究论文发展脉络Chat Paper正在生成论文摘要