Improvement of Q (rr) -I (DSS) and dynamic avalanche of field-plate MOSFET by local lifetime control on the cathode side
JAPANESE JOURNAL OF APPLIED PHYSICS(2022)
摘要
Reducing the reverse recovery charge (Q (rr)) is effective for reducing switching loss in field plate (FP)-MOSFETs. A lifetime killer is utilized to reduce Q (rr) while increasing the leakage current in the off-state. Device simulation shows that a local lifetime killer on the cathode side successfully improves the trade-off between Q (rr) and I (DSS) in comparison with that of a uniform lifetime killer. A known issue of cathode lifetime killers is overshoot voltage by hard recovery. However, the overshoot voltage of FP-MOSFET decreases with a cathode lifetime killer owing to an internal snubber, which is a feature of FP-MOSFETs. An internal snubber with a large series resistance causes a dynamic avalanche by both the increase of FP potential and excess carriers in high-speed operation. The cathode lifetime killer also improves dynamic avalanche by excess carriers. Consequently, the cathode lifetime killer is preferable for high-speed FP-MOSFETs because the Q (rr)-I (DSS) trade-off and the trade-off between dynamic avalanche and I (DSS) are effectively improved.
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关键词
LVMOS, Field-Plate, MOSFET, Reverse recovery, Surge voltage, Local lifetime killer, cathode
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