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Measurement of Ionization Loss of 50 GeV Protons in Silicon with Smoothly Tunable Up to 1 Cm Thickness Using a Single Flat Detector

R. M. Nazhmudinov,A. V. Shchagin,A. S. Kubankin,A. G. Afonin,G. I. Britvich,A. A. Durum,M. Y. Kostin,V. A. Maisheev,V. I. Pitalev,Y. A. Chesnokov,A. A. Yanovich

JOURNAL OF INSTRUMENTATION（2022）

Cited 1|Views27
Key words
dE/dx detectors,Interaction of radiation with matter,Ionization and excitation processes,Solid state detectors
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