SET characterization of 130 nm flash-based FPGA device

Low-power, flash-based field programmable gate arrays (FPGAs) have attracted significant attention in space electronic systems due to their re-programmability feature and non-volatility. In this study, we discussed a method for continuous and synchronous measurement of single event transient (SET) pulse widths in the ProASIC3 flash-based FPGA. The dedicated SET test system and irradiation set-up were implemented under heavy-ion irradiation. The SET generation cross-sections, pulse widths and capture characteristics in combinational logic chains were analyzed. The results indicated that the SET pulse width distribution exhibited a log-normal function and the SET capture probability linearly increased with the working frequency.