Metrological evaluation of the influence of the detection gate width on a single photon detector through optical attenuation

Vitor Silva Tavares,Felipe Calliari,Elisabeth Costa Monteiro,Guilherme Penello Temporao

Measurement（2022）

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摘要

•Proposal of a method for metrological evaluation of SPAD detectors.•Suitable optical power for SPAD calibration as a function of the gate width.•Calibration curves linearity and low uncertainty for gate widths of4 ns and 8 ns.•Optimal range of product μ¯η for lowest values of expanded uncertainty.

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关键词

Single-photon detector,Single-photon avalanche diode,Gate width,Measurement uncertainty,Quantum metrology

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