The Effect of Angular Secondary Emission and Impact on Multipactor: Statistical Modeling and Threshold Analysis

Current theoretical approaches for efficient multipactor threshold analysis are mainly based on one-dimensional analytical model which only considers normal component of electron motion within multipactor process. This work presents an improved implementation method of multipactor statistical modeling by constructing the joint probability function with angular electron emission and impact regarded. On that basis, multipactor threshold calculation of both the parallel plates and coaxial lines are conducted and compared with the experimental results to quantitatively investigate the effect of angular secondary emission and impact on multipactor formation. Moreover, it also reveals that the $fd$ (the product of the frequency and gap) scaling law stands for multipactor of coaxial lines with a constant radius ratio.