Combining Experiments and a Novel Small Signal Model to Investigate the Degradation Mechanisms in Ferroelectric Tunnel Junctions

2022 IEEE International Reliability Physics Symposium (IRPS)(2022)

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摘要
Ferroelectric emerging memories have been found to perfectly act as ultra-low power synaptic weights but require a deeper investigation before their actual introduction in brain inspired computing platforms. In particular, the understanding of the physical mechanisms occurring during the lifetime of the ferroelectric tunnel junction memories is fundamental for the development of reliable neuromorp...
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关键词
Degradation,Aging,Fatigue,Turning,Reliability engineering,Junctions,Integrated circuit modeling
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