Parasitic Drain Series Resistance Effects on Non-conducting Hot Carrier Reliability

Two key mechanisms (i) trapping induced Parasitic Drain Series Resistance (PDSRI) and (ii) interface state generation ΔNit are both identified within non-conducting hot carrier injection (NCHCI). During NCHCI stress, the drain current degradation due to PDSRI is observed at the first time readout as a sudden shift and is followed by conventional (relatively lower) monotonically increasing shift du...