Comprehensive Analysis of RF Hot-Carrier Reliability Sensitivity and Design Explorations for 28GHz Power Amplifier Applications

J. Hai, F. Cacho,A. Divay, E. Lauga-Larroze,J.-D. Arnould, J. Forest, V. Knopik,X. Garros

2022 IEEE International Reliability Physics Symposium (IRPS)（2022）

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摘要

Design of reliable and high-performance radiofrequency (RF) power amplifiers (PA) in CMOS technologies is becoming more challenging due to the increasing reliability issues as we approach the scaling limit. To provide insight on hot-carrier injection (HCI) degradation at RF frequencies, this paper presents a comprehensive analysis to study HCI degradation at 28GHz with different PA architectures b...

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关键词

Radio frequency,Human computer interaction,Degradation,Semiconductor device modeling,Performance evaluation,Sensitivity analysis,Power amplifiers

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