An Ultralow-Power 65-nm Standard Cell Library for Near/Subthreshold Digital Circuits

IEEE Transactions on Very Large Scale Integration (VLSI) Systems(2022)

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摘要
In this brief, a standard cell library targeting ultra-low voltages (ULVs) is designed in a 65-nm low-power CMOS technology to enable digital integrated circuits (ICs) to achieve good tradeoff among speed, power consumption, area, and reliability in the near/subthreshold region. The transistor sizes in the standard cells are optimized by threshold voltage tuning and technology feature exploration ...
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关键词
Libraries,Transistors,Standards,MOSFET,Threshold voltage,Foundries,Tuning
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