Comparative Analysis of Upset-Multiplicity Occurrences due to Flash X-rays and Pulsed Neutrons in Commercial SRAMs

Chao Qi,Wei Chen,Yugang Wang,Guizhen Wang,Ruibin Li,Xiaoyan Bai,Xiaoming Jin

2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS)（2019）

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摘要

In this paper we propose an approach to distinguish between upset bursts induced by flash X-rays and pulsed neutrons, by analyzing upset-multiplicity occurrences. Test results of ISSI 65 nm SRAMs on a flash X-ray machine and a pulsed reactor are presented. We adopted binomial distributions to fit the obtained upset-multiplicity data. The pulsed-neutron results exhibit precise and consistent accord...

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关键词

flash X-rays,pulsed neutrons,dose rate upsets (DRUs),single event upsets (SEUs),upset multiplicity,binomial distribution,SRAM

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