Broadband characterization of low dielectric constant and low dielectric loss CYTUF cyanate ester printed circuit board material

Alina Deutsch,C.W. Surovic,Alphonso P. Lanzetta, Herschel A. Ainspan,Jean-Claude Abbiate,Alfred Viehbeck, Jeffrey C. Hedrick,J. M. Shaw, Stephen L. Tisdale,Elizabeth Foster,Paul W. Coteus

IEEE Transactions on Components, Packaging, and Manufacturing Technology: Part B（1996）

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摘要

Dielectric constant /spl epsi//sub r/ and broadband dielectric loss tan /spl delta/ measurements were performed for the thermoplastic toughened cyanate ester printed circuit board CYTUF material. Characterization of tan /spl delta/ over the 1-8 GHz frequency range was made using a simple short-pulse propagation technique. All the measurements were taken on four-metal-layer, 23/spl times/36 cm cards with representative transmission line structures. It was found the /spl epsi//sub r/=3.48-3.64 and tan /spl delta/=0.0095-0.01, which are much lower than for standard FR-4 material. The impact of improved characteristics on wireability is analyzed through simulations of representative printed circuit board interconnections.

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关键词

dielectric losses,dielectric materials,permittivity,polymers,printed circuit manufacture,1 to 8 GHz,CYTUF,broadband dielectric loss,dielectric constant,four-metal-layer cards,interconnections,printed circuit board material,short-pulse propagation,simulation,thermoplastic toughened cyanate ester,transmission line structures,wireability,

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