Design-Technology Co-Optimizations (DTCO) for General-Purpose Computing In-Memory Based on 55nm NOR Flash Technology

Yang Feng,Bing Chen,Jing Liu,Zhaohui Sun,Hongyang Hu,Junyu Zhang,Xuepeng Zhan,Jiezhi Chen

2021 IEEE International Electron Devices Meeting (IEDM)（2021）

引用 14|浏览11

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摘要

In this work, based on 55nm NOR flash technology, a general-purpose computing in-memory (CIM) architecture is proposed for the first time. By using a device-aware DTCO approach, a flash-based high-precision partial differential equation (PDE) solver is constructed with the 32-bit floating point (FP) calculation ability. Memory cells (4bit/cell) work at the quasi-saturation region to balance the pe...

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关键词

Fluctuations,Poisson equations,Voltage measurement,Voltage fluctuations,Programming,Common Information Model (computing),Arrays

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