Advancing 2D Monolayer CMOS Through Contact, Channel and Interface Engineering

K. P. O'Brien,C. J. Dorow,A. Penumatcha, K. Maxey,S. Lee,C. H. Naylor, A. Hsiao, B. Holybee, C. Rogan, D. Adams, T. Tronic, S. Ma,A. Oni,A. Sen Gupta, R. Bristol, S. Clendenning,M. Metz,U. Avci

2021 IEEE International Electron Devices Meeting (IEDM)(2021)

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摘要
2D CMOS transistors fabricated with transition metal dichalcogenide (TMD) materials are a potential replacement for silicon transistors at sub-12 nm channel length [LG]. We demonstrate record NMOS contacts using a high melting point metal, down to 146 Ω-µm contact resistance (Rc). We present the best PMOS performance on a grown monolayer WSe2 film with 50 µA/µm Ion and 141 mV/dec sub-th...
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关键词
Gold,Benchmark testing,Logic gates,Ions,Contact resistance,Optical imaging,Silicon
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